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Test and Measurement

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July 28, 2010 | Stefan Meissner
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Since its standardisation as IEEE 1149.1 in 1990, JTAG / Boundary Scan has developed to one of the most important technology within the ensemble of various test strategies. This topic’s high dynamics and practical relevance are marked by constantly new operation fields, system solutions and definitions of pursuing IEEE standards. The following article analyses the current technology state, provides support in the systematic categorization of available solutions and gives an outlook of the innovative technology’s future.







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